Teledyne Technologies has been granted a patent for a fault detection circuit for image sensors. The circuit includes a signal unit that applies an electrical signal to a column line of the pixel array, a determining unit that measures the response to the signal to determine if a fault exists, and a controller that controls the signal unit and determining unit. The circuit can detect one or more column faults in the pixel array. Multiple fault detection units can be used, each with a current source unit to measure the electrical response. GlobalData’s report on Teledyne Technologies gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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Fault detection circuit for column faults in image sensor
A recently granted patent (Publication Number: US11778134B2) describes a fault detection circuit for an image sensor. The circuit is designed to detect column faults in a pixel array of the image sensor. The pixel array consists of rows and columns of pixels, with each column connected to a respective column line.
The fault detection circuit includes a fault detection unit that comprises a signal unit, a determining unit, and a controller. The signal unit applies an electrical signal to a specific column line, while the determining unit measures the response to the applied signal and determines whether a fault exists for that column line. The controller controls both the signal unit and the determining unit and outputs the fault status for the column line.
The fault detection circuit is made up of multiple fault detection units, each with its own signal unit and determining unit. These units work together to detect faults in the column lines of the pixel array. The signal unit of each fault detection unit includes a current source unit, which can either sink or source current to or from the associated column line. The determining unit measures the electrical response to the current sourced or sunk by the current source unit to determine if a fault exists.
The patent also describes various fault detection modes and configurations for the circuit. The controller of the fault detection units can be individually addressed and controlled based on control parameters stored in a control register. The circuit can operate in a fault detection mode to determine the fault status of each column line and an output mode to output the fault status.
Additionally, the fault detection circuit includes a memory for storing the fault status of each column line. The fault detection units utilize flip-flops that function as a shift register when operating in the output mode to output the fault status for all column lines.
The patent also mentions the integration of the fault detection circuit into a readout circuit for reading out the column lines of the image sensor. The readout circuit includes a reading unit for reading out pixel signals and is controlled by the same controller as the fault detection circuit.
Overall, this patent describes a fault detection circuit that can accurately detect column faults in an image sensor's pixel array, providing valuable information for troubleshooting and maintenance purposes.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
