Samsung Electronics has patented a semiconductor memory device featuring a vertically stacked configuration of a volatile memory die and a nonvolatile test chip. The test chip logs command and address information during normal operation and can read this data in debugging mode, enhancing diagnostic capabilities for host device interactions. GlobalData’s report on Samsung Electronics gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Samsung Electronics, was a key innovation area identified from patents. Samsung Electronics's grant share as of June 2024 was 58%. Grant share is based on the ratio of number of grants to total number of patents.
Stacked semiconductor memory device with logging and debugging capabilities
The patent US12045496B2 describes a semiconductor memory device that integrates a memory semiconductor die and a test chip, which are vertically stacked. The memory semiconductor die contains a volatile memory device that operates in response to commands and addresses from a host device. The test chip features a nonvolatile memory device designed to log information related to these commands and addresses during normal operation. In a debugging mode, the test chip can read this log information and output it through designated test data pads. The device is capable of switching between normal and debugging modes based on commands received from the host, allowing for efficient logging and retrieval of operational data.
Additionally, the test chip includes functionalities such as a buffer memory for temporary storage of log information, an error correction code (ECC) engine for encoding and decoding log data, and a timer for timestamping log entries. The test chip can also generate a mapping table that correlates logical addresses from the host device with physical addresses in the nonvolatile memory. This mapping aids in managing storage space and ensuring that log information is accurately recorded and retrievable. The design allows for the logging of operational data without interrupting the normal functions of the volatile memory device, enhancing the overall reliability and performance of the semiconductor memory device.
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By GlobalDataTo know more about GlobalData’s detailed insights on Samsung Electronics, buy the report here.
