Konica Minolta. has been granted a patent for a non-destructive inspection method of magnetic materials within non-magnetic bodies. The method involves applying a magnetic field and measuring its distribution at varying distances using a magnetic sensor, allowing for effective evaluation of the magnetic material’s properties. GlobalData’s report on Konica Minolta gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on Konica Minolta, E-transaction user interfaces was a key innovation area identified from patents. Konica Minolta's grant share as of June 2024 was 35%. Grant share is based on the ratio of number of grants to total number of patents.
Non-destructive inspection method for magnetic materials
The patent US12044654B2 outlines a non-destructive inspection method and device designed to evaluate magnetic materials embedded within non-magnetic bodies. The method involves applying a magnetic field of either N or S polarity to the inspection target and measuring the resultant magnetic field at various distances from the magnetic field applying unit. This measurement is conducted using a magnetic sensor positioned on the surface of the non-magnetic body. The process includes two distinct measuring phases, where the magnetic field applying unit is alternately positioned on either side of the sensor, allowing for a comprehensive assessment of the magnetic field distribution and its attenuation with distance.
The device comprises a magnetic field applying unit and a sensor unit capable of measuring magnetic fields at multiple positions. The magnetic field applying unit can be attached or detached from either end of the sensor unit, facilitating flexible measurement configurations. The sensor unit may include multiple magnetic sensors arranged in a two-dimensional array, enabling detailed data collection. The device is designed to output measurement data, which can be processed to determine the state of the inspection target. This includes calculating determination data based on the acquired measurements, potentially identifying abnormalities by analyzing the synthesized data. The patent also describes methods for correcting measurement data based on distance and for subtracting complementary measurement data to enhance accuracy in determining the condition of the inspection target.
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