FormFactor. has been granted a patent for a modular probe array designed for temporary electrical contact with devices under test. The innovation features multiple probe heads with improved thermal cycling performance, utilizing an O-ring for enhanced mechanical centering of the substrate within the mounting block. GlobalData’s report on FormFactor gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on FormFactor, Under-screen biometric identification was a key innovation area identified from patents. FormFactor's grant share as of June 2024 was 58%. Grant share is based on the ratio of number of grants to total number of patents.
Modular probe array for temporary electrical contact testing
The granted patent US12044704B2 introduces a modular probe array designed for establishing temporary electrical connections with devices under test. This innovative array consists of multiple probe heads that are laterally spaced on a probe card. Each probe head features a mounting block that secures a substrate, which is positioned within an opening of the mounting block. A spring-head is attached to the substrate, incorporating two or more vertical probes that facilitate electrical contact with the device. Notably, an O-ring is integrated into the design, positioned in the lateral gap between the substrate and the mounting block, enhancing the mechanical centering of the substrate.
Additionally, the patent outlines features that further refine the modular probe array's functionality. It includes set screws that allow for the adjustment of the substrate's lateral position within the mounting block for at least one of the probe heads. Some spring-heads are equipped with upper and lower guide plates, which assist in directing the movement of the vertical probes. Furthermore, the substrate can be constructed as a multi-level ceramic structure, contributing to the overall versatility and effectiveness of the probe array in various testing scenarios.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
