FormFactor. has been granted a patent for a modular probe array designed for temporary electrical contact with devices under test. The innovation features multiple probe heads with improved thermal cycling performance, utilizing an O-ring for enhanced mechanical centering of the substrate within the mounting block. GlobalData’s report on FormFactor gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on FormFactor, Under-screen biometric identification was a key innovation area identified from patents. FormFactor's grant share as of July 2024 was 59%. Grant share is based on the ratio of number of grants to total number of patents.
Modular probe array for temporary electrical contact testing
The granted patent US12044704B2 introduces a modular probe array designed for establishing temporary electrical connections with devices under test. This innovative array consists of multiple probe heads that are laterally spaced on a probe card. Each probe head features a mounting block that secures a substrate, which is positioned within an opening of the mounting block. The design incorporates a spring-head attached to the substrate, equipped with multiple vertical probes that facilitate electrical contact. Additionally, an O-ring is strategically placed in the lateral gap between the substrate and the mounting block to enhance the mechanical centering of the substrate, ensuring precise alignment during testing.
Further enhancements to the modular probe array include the incorporation of set screws that allow for the adjustment of the substrate's lateral position within the mounting block, providing flexibility in alignment for at least one of the probe heads. The design may also feature upper and lower guide plates on at least one spring-head, which serve to direct the movement of the vertical probes, thereby improving operational efficiency. Notably, the substrate can be constructed as a multi-level ceramic structure, contributing to the overall robustness and functionality of the probe array in various testing scenarios.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
