Intel had 48 patents in advanced materials during Q1 2024. Intel Corp’s patents in Q1 2024 focus on innovative integrated circuit structures, including gate-all-around structures with deep via substrate contacts, wrap-around contact structures for nanowires, depopulated channel structures, and devices with channel-to-substrate electrical contact. These structures aim to improve electrical contact, isolation, and overall performance of semiconductor devices. GlobalData’s report on Intel gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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Intel grant share with advanced materials as a theme is 27% in Q1 2024. Grant share is based on the ratio of number of grants to total number of patents.
Recent Patents
Application: Defect detection using thermal laser stimulation and atomic force microscopy (Patent ID: US20240069095A1)
The patent filed by Intel Corp. describes an inspection tool that combines an integrated optical laser unit and atomic force probe unit with a detector unit, all controlled by a processor. This tool is used to perform fault location analysis on a device under test, allowing for the detection of defects. The method involves conducting scans with the atomic force probe unit to locate defects, followed by scans with the optical laser unit to generate localized heating at specific defect locations, ultimately providing a detailed map of defect locations on the device.
The inspection tool includes an optical laser unit for surface scanning, an atomic force probe unit with a detector for monitoring probe movements, and a processor for fault location analysis and map generation. The method involves conducting scans with the atomic force probe unit to identify defect locations, using the optical laser unit to generate localized heating at specific defect locations, and performing additional scans to pinpoint the exact location of defects. The tool and method are designed to provide detailed analysis and mapping of defects in devices under test, allowing for efficient fault detection and analysis.
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GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.
