FormFactor has been granted a patent for probe systems with imaging devices and objective lens isolators. The system includes an enclosure, testing assembly, imaging device, and electrical grounding assembly to restrict electromagnetic noise. The method involves assembling the imaging device to isolate the objective lens from the body. GlobalData’s report on FormFactor gives a 360-degree view of the company including its patenting strategy. Buy the report here.
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According to GlobalData’s company profile on FormFactor, Under-screen biometric identification was a key innovation area identified from patents. FormFactor's grant share as of January 2024 was 56%. Grant share is based on the ratio of number of grants to total number of patents.
Probe system with imaging device and objective lens isolator
A recently granted patent (Publication Number: US11874301B2) discloses a probe system designed to test devices under test (DUTs) within a substrate. The system includes an enclosure, a testing assembly, an imaging device, and an electrical grounding assembly. The imaging device comprises an objective lens, a body, and an isolator to electrically isolate the lens from the body. Additionally, the system features an electrical grounding assembly to restrict electromagnetic noise, including a grounding conductor connecting the lens to an electrical ground.
Furthermore, the probe system includes a chuck with a chuck support surface to hold the substrate, with a chuck grounding conductor connecting the chuck to the enclosure or electrical ground. The system's objective lens isolator supports the lens in a fixed position relative to the body, with components made of insulating materials. The system's testing assembly includes probe arms, probes, and manipulators for positioning the probes relative to the DUTs, with an electrical grounding assembly to restrict noise and probe arm grounding conductors connecting the probe arms to corresponding probe arm slits in the enclosure. The patent also details methods for preparing and utilizing the imaging device within the probe system, emphasizing the importance of restricting electrical noise during testing procedures.
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